USB 3.2/3.1/3.0/2.0
PD 2.0, PD 3.0
Continuity/Shorts/Opens testing with dynamic visualization of test results
Individually measure the DC resistance of VBUS and GND wires
Individually measure the DC resistance of VBUS and GND pins in the USB Type-C connector
Testing of USB 2.0 pairs is supported at about 518 Mbps, and any present SuperSpeed pairs tested at 5 Gbps or 10 Gbps
E-Marker verification
Signal integrity testing of data lines to 12.8 Gbps per channel
Insertion/test count tracking ensures reliable operation
By using the highest quality connectors, the expected life span without any test degradation for the Type-C bundle modules is 5,000 tests per module
All connector modules require the use of the Total Phase Advanced Cable Tester v2