Celebrating 30 Years of Innovation at DesignCon ’25
Derek Cooper

This past week, Total Phase exhibited at the DesignCon ’25 conference at the Santa Clara Convention Center.

DesignCon Conference and Expo

DesignCon is a premier annual conference and expo that brings together engineers and industry experts from the semiconductor, aerospace, automotive, communications, and consumer electronics industries. Focused on high-speed electronics, signal integrity, and system design, this show serves as a central hub for learning, networking, and discovering cutting-edge tools and technologies that shape the future of electronic engineering.

This year marked the 30th anniversary of the show, featuring special activities such as a '30 Years of Tech' timeline, along with keynote presentations exploring emerging trends in AI, big data, and memory technologies.

The show had a tremendous turnout as we were visited by hundreds of embedded systems engineers from both local and international companies. There were also plenty of existing and past customers with expertise in serial buses who stopped by to discuss their use cases, upcoming projects, and experience with Total Phase’s solutions assisting with their I2C, SPI, USB or CAN debugging and development needs.

Total Phase booth at DesignCon 2025

Booth Demos

On display at the Total Phase booth were live demonstrations of our embedded solutions, including our Promira Serial Platform coupled with the Beagle I2C/SPI Protocol Analyzer to showcase a real-time I2C data capture in our Data Center Software, as well as our Beagle USB 480 Protocol Analyzer capturing USB 2.0 traffic. We also featured our Advanced Cable Tester v2 in action, performing a comprehensive test on a USB Type-C cable that includes assessments on Pin Continuity, DC Resistance, E-Marker, and Signal Integrity.

 

I2C prototype demo

 

Individuals were impressed by the Promira platform’s flexible high-speed I2C and SPI capabilities in addition to supporting Ethernet connectivity and lower voltage tolerances. The Advanced Cable Tester v2 drew attendees in with its rapid, high-precision signal integrity measurements and eye diagram outputs, delivering detailed cable insights within a matter of seconds.

For those who missed seeing these demos live in person, you can watch them here: 

If you are finding challenges with effectively debugging in common serial protocols such as I2C, SPI, USB, CAN, or eSPI, or you are one of many companies who are concerned with the safety and reliability of next generation USB cables, then please contact us at  sales@totalphase.com - we’d love to help!