I have a question about using the Advanced Cable Tester v2.
The USB 3.1 specification includes handling lane bit inversion. For example, the “+” and “-“ lines in a SuperSpeed or SuperSpeed+ differential pair can be swapped.
Can you confirm that the Advanced Cable Tester v2 will properly execute the SS and SS+ eye tests on a cable if the differential signal lines in one or more SS or SS+ differential signal pairs are swapped? In other words, will the tester properly perform the SS and/or SS+ eye diagram test on a SS or SS+ lane if that lane has SSTX- connected to SSRX+ and vice versa?"
Response from Technical Support:Thanks for your question! The Advanced Cable Tester v2 has independent receivers. Bit patterns are not a concern - the inversion in polarity will not be an issue. The cable will be testable, provided it does not have continuity problems.
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